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An Original Tin-Covered Carbon Paste Electrode Combined N-Doped CMK-3 to Detect Trace Copper by Anodic Stripping Voltammetry

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An original tin-covered carbon paste electrode combined N-doped CMK-3 was discussed. As one kind of the ordered mesoporous carbons (OMCs), N-doped CMK-3 has advantages of conducting electrons because the pore is regularly ordered and controllable, with the pore diameters of 7–9 nm, pore volume of 0.65–0.7 cm3 g–1, specific square area of 500–600 m2 g–1. The Sn/N-doped CMK-3/CPE enhanced the signal of peak current for detection of Cu(II), which is better than the N-doped CMK-3 modified carbon paste electrode, the bare carbon paste electrode, and the tin film modified carbon paste electrode. The optimum conditions are as follows: the mass of N-doped CMK-3 is 4 mg, the Sn(II) concentration is 7.5 mg L–1, the deposition potential is –1.3 V, and the deposition time is 350 s, the pH of the hydrochloric acid solution is 4.75. The Sn/N-doped CMK-3/CPE exhibited large linear range of 6.0–100.0 μg L–1 with the detection limit of 0.073 μmol L–1 for Cu(II). The sensor shows eminent results in the process of detecting Cu(II) in river samples with good recoveries.
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Keywords: BARE CPE; N-DOPED CMK-3/CPE; ORDERED MESOPOROUS CARBONS (OMCS); SN/CPE; SN/N-DOPED CMK-3/CPE; TRACE COPPER

Document Type: Research Article

Publication date: July 1, 2018

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  • Journal of Nanoelectronics and Optoelectronics (JNO) is an international and cross-disciplinary peer reviewed journal to consolidate emerging experimental and theoretical research activities in the areas of nanoscale electronic and optoelectronic materials and devices into a single and unique reference source. JNO aims to facilitate the dissemination of interdisciplinary research results in the inter-related and converging fields of nanoelectronics and optoelectronics.
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