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Formation and Identification of Graphene

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The graphene flakes were prepared by a micromechanical cleavage of a highly oriented pyrolytic graphite (HOPG) and were deposited on silicon substrates covered with thin films of SiO2, ZnS or ZrO2 of different thickness. A good adhesion and good contrast have been achieved. The films have been studied with the Raman scattering technique. In this work we present a modeling of the light beam passage through a three layer system "graphene-thin film-silicon" and a calculation of the graphene vision contrast dependence on the incident light wavelength. A refractive index and a thickness of the covering thin film were also varied in this work. As a conclusion a material being transparent in a visible spectral range with the refractive index ranging from 2 to 2.2 should be chosen for the best graphene layer contrast.
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Keywords: CARBON NANOMATERIAL; GRAPHENE; GRAPHITIC MONOLAYER; IDENTIFICATION; RAMAN SPECTROSCOPY

Document Type: Research Article

Publication date: August 1, 2009

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  • Journal of Nanoelectronics and Optoelectronics (JNO) is an international and cross-disciplinary peer reviewed journal to consolidate emerging experimental and theoretical research activities in the areas of nanoscale electronic and optoelectronic materials and devices into a single and unique reference source. JNO aims to facilitate the dissemination of interdisciplinary research results in the inter-related and converging fields of nanoelectronics and optoelectronics.
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