Effects of Er-Doping on Amorphous InZnSnO/InZnSnO:Er Double-Channel Thin-Film Transistors
We study the effects of Er-doping on the electrical performances and stabilities of amorphous InZnSnO(IZTO)/IZTO:Er double-channel thin-film transistors (TFTs). Compared to conventional IZTO single-channel TFTs, the IZTO(front)/IZTO:Er(back) double-channel TFTs exhibits higher field-effect
mobility and improved stability under both positive and negative bias stresses. From the X-ray photoelectron spectroscopy for the double channel, we observe that Er doping contributes to an enhancement of the oxygen bonding and a reduction of oxygen vacancies in the IZTO thin-film. These results
show that the Er can be an effective carrier suppressor in IZTO-based TFTs.
Keywords: Doped Er; Mobility; Stability; a-IZTO TFT
Document Type: Research Article
Affiliations: 1: School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 06974, Korea 2: Electronics and Telecommunications Research Institute, Daejeon 34129, Korea
Publication date: May 1, 2017
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