Controlled Nanocrack Patterns for Nanowires
Recent experiments have shown a new approach of nanowire fabrication by filling cracks with semiconductor materials or metals. Full exploration of this approach calls for a computational model to predict the crack patterns in a thin film. This paper considers crack propagation in a heterogeneous thin film with etched space and stressers for cracking guidance. A phase field model applicable to multiple materials is proposed, which eliminates the need of explicit crack front tracking. The elastic field is solved by an efficient iteration process in Fourier space. The computations show that the propagation direction of nanocracks can be effectively controlled via pre-patterning.
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Document Type: Research Article
Publication date: 01 April 2006
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- Journal of Computational and Theoretical Nanoscience is an international peer-reviewed journal with a wide-ranging coverage, consolidates research activities in all aspects of computational and theoretical nanoscience into a single reference source. This journal offers scientists and engineers peer-reviewed research papers in all aspects of computational and theoretical nanoscience and nanotechnology in chemistry, physics, materials science, engineering and biology to publish original full papers and timely state-of-the-art reviews and short communications encompassing the fundamental and applied research.
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