@article {Ailawalia:2017:2168-1996:157,
title = "Effect of Thermoelectric Coupling Parameter in a Semiconducting Medium Under Photothermal Theory",
journal = "Journal of Advanced Physics",
parent_itemid = "infobike://asp/jap",
publishercode ="asp",
year = "2017",
volume = "6",
number = "1",
publication date ="2017-03-01T00:00:00",
pages = "157-162",
itemtype = "ARTICLE",
issn = "2168-1996",
eissn = "2168-2003",
url = "https://www.ingentaconnect.com/content/asp/jap/2017/00000006/00000001/art00023",
doi = "doi:10.1166/jap.2017.1284",
keyword = "ELASTIC LAYER, THERMOELASTICITY, PHOTOTHERMAL, COUPLING PARAMETER",
author = "Ailawalia, Praveen and Singla, Amit",
abstract = "The purpose of this paper is to study the two dimensional deformation in a semi-infinite semiconducting medium. The deformation is caused subjected to a mechanical force applied along the interface of elastic layer of thickness h and a semiconducting medium. Normal Mode analysis
has been used to obtain the exact expression of normal displacement, normal force stress, temperature distribution and carrier density. The effect of this force and thermoelectric coupling parameter on the displacement component, force stress, temperature distribution and carrier density has
been depicted graphically.",
}