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New Data on the Flexural and Torsional Vibrations of Rectangular Atomic Force Microscope Cantilevers

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The resonant frequency of flexural and torsional vibrations for an atomic force microscope (AFM) cantilever has been investigated using the Euler-Bernoulli beam theory. The results show that for flexural vibration the frequency is sensitive to the contact position, the first frequency is sensitive only to the lower contact stiffness, but high order modes are sensitive in a larger range of contact stiffness. By increasing the height H, for a limited range of contact stiffness the sensitivity to the contact stiffness increases. Furthermore, by increasing the angle between the cantilever and sample surface, the frequency decreases. For torsional vibration, the first mode is sensitive to the contact position, the first frequency is sensitive only to the lower lateral contact stiffness, but high order modes are sensitive in a larger range of lateral contact stiffness. All torsional modes are sensitive to the contact position.
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Keywords: ATOMIC FORCE MICROSCOPE; FLEXURAL VIBRATION; RECTANGULAR CANTILEVER; TORSIONAL VIBRATION

Document Type: Research Article

Publication date: June 1, 2016

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  • Journal of Advanced Microscopy Research (JAMR) provides a forum for rapid dissemination of important developments in high-resolution microscopy techniques to image, characterize and analyze man-made and natural samples; to study physicochemical phenomena such as abrasion, adhesion, corrosion and friction; to perform micro and nanofabrication, lithography, patterning, micro and nanomanipulation; theory and modeling, as well as their applications in all areas of science, engineering, and medicine.
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