There have been some development to achieve programmable Memory Built In Self-Test (MBIST) which allow for programmability, however even these are inflexible as they cannot be used to test different memory sizes and different memory data bus width. The programmability of choosing different
operation is limited because the programmability is in the form of microcode or instruction based testing. This means that some form of software have to be written to represent the microcode or the instructions to achieve the mentioned memory test operation. With these limitations, this design
elaborates a method that allows complete programmability on the fly by allowing different memory sizes, different memory data bus width and 6 different memory test operations to be chosen to test a memory device either single port or dual port Static Random Access Memory (SRAM) memories.
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Document Type: Research Article
Integrated Circuit Development Department, MIMOS Berhad, Technology Park Malaysia, Bukit Jalil, 57000 Kuala Lumpur, Malaysia
Emerald System Sdn Bhd, Pulau Pinang, Malaysia
Publication date: November 1, 2017
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