Skip to main content
padlock icon - secure page this page is secure

Programmable MBIST with High Flexibility Control

Buy Article:

$106.51 + tax (Refund Policy)

There have been some development to achieve programmable Memory Built In Self-Test (MBIST) which allow for programmability, however even these are inflexible as they cannot be used to test different memory sizes and different memory data bus width. The programmability of choosing different operation is limited because the programmability is in the form of microcode or instruction based testing. This means that some form of software have to be written to represent the microcode or the instructions to achieve the mentioned memory test operation. With these limitations, this design elaborates a method that allows complete programmability on the fly by allowing different memory sizes, different memory data bus width and 6 different memory test operations to be chosen to test a memory device either single port or dual port Static Random Access Memory (SRAM) memories.
No Reference information available - sign in for access.
No Citation information available - sign in for access.
No Supplementary Data.
No Article Media
No Metrics

Keywords: Architecture; Flexibility Control; Programmable MBIST

Document Type: Research Article

Affiliations: 1: Integrated Circuit Development Department, MIMOS Berhad, Technology Park Malaysia, Bukit Jalil, 57000 Kuala Lumpur, Malaysia 2: Emerald System Sdn Bhd, Pulau Pinang, Malaysia

Publication date: November 1, 2017

More about this publication?
  • ADVANCED SCIENCE LETTERS is an international peer-reviewed journal with a very wide-ranging coverage, consolidates research activities in all areas of (1) Physical Sciences, (2) Biological Sciences, (3) Mathematical Sciences, (4) Engineering, (5) Computer and Information Sciences, and (6) Geosciences to publish original short communications, full research papers and timely brief (mini) reviews with authors photo and biography encompassing the basic and applied research and current developments in educational aspects of these scientific areas.
  • Editorial Board
  • Information for Authors
  • Subscribe to this Title
  • Ingenta Connect is not responsible for the content or availability of external websites
  • Access Key
  • Free content
  • Partial Free content
  • New content
  • Open access content
  • Partial Open access content
  • Subscribed content
  • Partial Subscribed content
  • Free trial content
Cookie Policy
X
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more