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Programmable MBIST with High Flexibility Control

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There have been some development to achieve programmable Memory Built In Self-Test (MBIST) which allow for programmability, however even these are inflexible as they cannot be used to test different memory sizes and different memory data bus width. The programmability of choosing different operation is limited because the programmability is in the form of microcode or instruction based testing. This means that some form of software have to be written to represent the microcode or the instructions to achieve the mentioned memory test operation. With these limitations, this design elaborates a method that allows complete programmability on the fly by allowing different memory sizes, different memory data bus width and 6 different memory test operations to be chosen to test a memory device either single port or dual port Static Random Access Memory (SRAM) memories.
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Keywords: Architecture; Flexibility Control; Programmable MBIST

Document Type: Research Article

Affiliations: 1: Integrated Circuit Development Department, MIMOS Berhad, Technology Park Malaysia, Bukit Jalil, 57000 Kuala Lumpur, Malaysia 2: Emerald System Sdn Bhd, Pulau Pinang, Malaysia

Publication date: November 1, 2017

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  • ADVANCED SCIENCE LETTERS is an international peer-reviewed journal with a very wide-ranging coverage, consolidates research activities in all areas of (1) Physical Sciences, (2) Biological Sciences, (3) Mathematical Sciences, (4) Engineering, (5) Computer and Information Sciences, and (6) Geosciences to publish original short communications, full research papers and timely brief (mini) reviews with authors photo and biography encompassing the basic and applied research and current developments in educational aspects of these scientific areas.
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