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Temperature Effect on the Optical and Mechanical Properties of Silver Thin Film Deposited on Glass Substrate

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Silver film with high reflectivity and low absorption in the visible wavelength region has been widely used in optical applications. In this investigation, silver optical thin films were prepared on the glass substrate at various temperatures by electron-beam vapor deposition. The reflectivity of the Ag thin film was measured by a Perkin-Elmer Lambda spectrophotometer in the wavelength region of 450–680 nm. The experimental measurements of reflectivity were validated with the numerical results using the Essential Macleod software. The surface topology of Ag films was examined by means of atomic force microscope (AFM). The effects of the substrate temperature on the reflectivity were presented through a parametric study. Nanoindentation tests were employed to determine the hardness and Young's modulus of the film. The measured hardness and Young's modulus of the silver thin film were found to depend on the penetration depth.
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Document Type: Research Article

Publication date: September 1, 2013

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  • ADVANCED SCIENCE LETTERS is an international peer-reviewed journal with a very wide-ranging coverage, consolidates research activities in all areas of (1) Physical Sciences, (2) Biological Sciences, (3) Mathematical Sciences, (4) Engineering, (5) Computer and Information Sciences, and (6) Geosciences to publish original short communications, full research papers and timely brief (mini) reviews with authors photo and biography encompassing the basic and applied research and current developments in educational aspects of these scientific areas.
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