Bias Voltage Dependence of Silver and Molybdenum Single-Atom-Width Wire Formation
We elongated silver (Ag) and molybdenum (Mo) nanocontacts under an applied bias voltage inside a transmission electron microscope (TEM). The elongation process was observed in situ by lattice imaging. Single-atom-width wires (SWs) of both metals formed over certain bias voltage
ranges. We investigated the probability of SW formation over a range of bias voltages. The Ag SW formation probability was lower at high bias voltages. No Ag SWs were formed at voltages higher than 20 mV. Conversely, the formation probability of Mo SWs showed no dependence on bias voltage
in the range 0–150 mV.
Keywords: HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MOLYBDENUM; SILVER; SINGLE-ATOM-WIDTH WIRES
Document Type: Short Communication
Publication date: 01 August 2016
- Nanoscience and Nanotechnology Letters (NNL) is a multidisciplinary peer-reviewed journal consolidating nanoscale research activities in all disciplines of science, engineering and medicine into a single and unique reference source. NNL provides the means for scientists, engineers, medical experts and technocrats to publish original short research articles as communications/letters of important new scientific and technological findings, encompassing the fundamental and applied research in all disciplines of the physical sciences, engineering and medicine.
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