Search Results

Precision magnetic quadrupole lens for a nuclear scanning microprobe based on an ÉGP-10 electrostatic tandem accelerator

Authors: Rebrov, V.; Ponomarev, A.; Magilin, D.; Beloshapka, I.; Dudnik, A.; Abramovich, S.; Zavjalov, N.; Zvenigorodsky, A.; Zimin, E.

Source: Technical Physics, Volume 52, Number 3, March 2007 , pp. 365-368(4)

Publisher: MAIK Nauka/Interperiodica

An automated high performance capillary liquid chromatography-Fourier transform ion cyclotron resonance mass spectrometer for high-throughput proteomics

Authors: Belov M.E.; Anderson G.A.; Wingerd M.A.; Udseth H.R.; Tang K.; Prior D.C.; Swanson K.R.; Buschbach M.A.; Strittmatter E.F.; Moore R.J.; Smith R.D.

Source: Journal of the American Society for Mass Spectrometry, Volume 15, Number 2, 2004 , pp. 212-232(21)

Publisher: Elsevier

In-flight RI beam separator BigRIPS at RIKEN and elsewhere in Japan

Author: Kubo T.

Source: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 204, Number unknown, May 2003 , pp. 97-113(17)

Publisher: Elsevier

Characterisation of product ions in high-energy tandem mass spectra of protonated oligonucleotides formed by electrospray ionisation3

Authors: Weimann A.; Iannitti-Tito P.; Sheil M.M.

Source: International Journal of Mass Spectrometry, Volume 194, Number 2, 7 January 2000 , pp. 269-288(20)

Publisher: Elsevier

A novel tandem quadrupole mass analyzer

Authors: Du Z.; Douglas D.J.

Source: Journal of the American Society for Mass Spectrometry, Volume 10, Number 11, November 1999 , pp. 1053-1066(14)

Publisher: Elsevier

Applications of Collision Dynamics in Quadrupole Mass Spectrometry - Techniques and Applications of Tandem Mass Spectrometry

Author: Douglas D.J.

Source: Journal of the American Society for Mass Spectrometry, Volume 9, Number 2, February 1998 , pp. 101-113(13)

Publisher: Elsevier

Attenuation of Polyatomic Ion Interferences in Inductively Coupled Plasma Mass Spectrometry by Gas-Phase Collisions

Authors: Rowan, John T.; Houk, R.S.

Source: Applied Spectroscopy, Volume 43, Issue 6, Pages 899-1104 (August 1989) , pp. 976-980(5)

Publisher: Society for Applied Spectroscopy