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9 articles with title/keywords/abstract containing SPECKLE-SHEARING INTERFEROMETRY

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Inspection of Wafer Defects with Speckle-Shearing Interferometry and X-ray Microscopy

Authors: Jun, Wang; Matham, Murukeshan V.; Krishna, Juluri B.; Ngoi, Bryan K.A.

Source: Journal of Holography and Speckle, Volume 3, Number 1, June 2006 , pp. 22-26(5)

Publisher: American Scientific Publishers

Deformation Measurement Using Shearography for Surface Indentation

Authors: Casillas, F.J.; Dávila, A.; Garnica, G.; Rayas, J.A.

Source: Journal of Holography and Speckle, Volume 2, Number 1, April 2005 , pp. 14-19(6)

Publisher: American Scientific Publishers

Measurement of out-of-plane deformation by combination of speckle photography and speckle shearing interferometry

Authors: B Barrientos; R A. Martínez-Celorio; Luis M.a.r.t.í. López; J J. Dirckx; Moisés Cywiak

Source: Optik – International Journal for Light and Electron Optics, Volume 115, Number 6, September 2004 , pp. 248-252(5)

Publisher: Urban & Fischer

Iterative Fourier transform method for phase map recovery in electronic speckle-shearing pattern interferometry

Authors: Davila A.; Mendiola G.; Casillas F.J.

Source: Optics and Lasers in Engineering, Volume 41, Number 4, April 2004 , pp. 649-658(10)

Publisher: Elsevier

Digital transform processing of carrier fringe patterns from speckle-shearing interferometry

Authors: Fang J.; Xiong C.Y.; Yang Z.L.

Source: Journal of Modern Optics, Volume 48, Number 3, March 10, 2001 , pp. 507-520(14)

Publisher: Taylor and Francis Ltd

Measurement of slopes and profile of an optical lens by shearography

Authors: C. J.T.; H. M.S.; A. L.N.

Source: Measurement, Volume 18, Number 3, July 1996 , pp. 185-191(7)

Publisher: Elsevier

A carrier method of speckle-shearing interferometry for individual-component patterns of in-plane strain

Authors: J. F.; Laermann K.H.

Source: Optics and Laser Technology, Volume 27, Number 3, June 1995 , pp. 139-143(5)

Publisher: Elsevier

Fringe Variation and Visibility in Speckle-shearing Interferometry

Author: Fang J.

Source: Journal of Modern Optics, Volume 37, Number 12, December 1990 , pp. 2073-2083(11)

Publisher: Taylor and Francis Ltd

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