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Inspection of Wafer Defects with Speckle-Shearing Interferometry and X-ray Microscopy

Authors: Jun, Wang; Matham, Murukeshan V.; Krishna, Juluri B.; Ngoi, Bryan K.A.

Source: Journal of Holography and Speckle, Volume 3, Number 1, June 2006 , pp. 22-26(5)

Publisher: American Scientific Publishers

Hybrid Inorganic-Organic Sol–Gel Coatings in the SiO₂-TiO₂ System

Authors: Zaharescu, Maria; Crisan, Maria; Predoana, Luminita; Gartner, Mariuca; Cristea, Dana; Degeratu, Stefania; Manea, Elena

Source: Journal of Sol-Gel Science and Technology, Volume 32, Numbers 1-3, December 2004 , pp. 173-177(5)

Publisher: Springer

Low optical loss germanosilicate planar waveguides by low-pressure inductively coupled plasma-enhanced chemical vapor deposition

Authors: Zhang Q.Y.; Pita K.; Ho C.K.F.; Ngo N.Q.; Zuo L.P.; Takahashi S.

Source: Chemical Physics Letters, Volume 368, Number 1, 14 January 2003 , pp. 183-188(6)

Publisher: Elsevier

Influence of the Film-Electrode Interface in Thin-Film Capacitors

Authors: Ellerkmann U.; Liedtke R.; Waser R.

Source: Ferroelectrics, Volume 271, Number 1, 2002 , pp. 315-320(6)

Publisher: Taylor and Francis Ltd

Low optical loss germanosilicate planar waveguides by low-pressure inductively coupled plasma-enhanced chemical vapor deposition

Authors: Zhang Q.Y.; Pita K.; Ho C.K.F.; Ngo N.Q.; Zuo L.P.; Takahashi S.

Source: Chemical Physics Letters, Volume 368, Number 1, 14 January 2002 , pp. 183-188(6)

Publisher: Elsevier

Growth and properties of LPCVD W-Si-N barrier layers

Authors: Bystrova S.; Holleman J.; Woerlee P.H.

Source: Microelectronic Engineering, Volume 55, Number 1, March 2001 , pp. 189-195(7)

Publisher: Elsevier

Low Z total reflection X-ray fluorescence analysis - challenges and answers

Authors: Streli C.; Kregsamer P.; Wobrauschek P.; Gatterbauer H.; Pianetta P.; Pahlke S.; Fabry L.; Palmetshofer L.; Schmeling M.

Source: Spectrochimica Acta Part B: Atomic Spectroscopy, Volume 54, Number 10, 25 October 1999 , pp. 1433-1441(9)

Publisher: Elsevier

High-temperature optical properties and stability of selective absorbers based on quasicrystalline AlCuFe

Authors: van Hoogdalem E.J.; Eisenhammer T.; Haugeneder A.; Mahr A.

Source: Solar Energy Materials and Solar Cells, Volume 54, Number 1, 13 July 1998 , pp. 379-386(8)

Publisher: Elsevier

MOCVD growth of (100)-oriented CeO₂ thin films on hydrogen-terminated Si(100) substrates

Authors: Ami T.; Suzuki M.

Source: Materials Science and Engineering: B, Volume 54, Number 1, 12 June 1998 , pp. 84-91(8)

Publisher: Elsevier

Mechanical stress in coevaporated -FeSi_2+v thin films on silicon substrates

Authors: Herz K.; Bruckner W.

Source: Applied Surface Science, Volume 134, Number 1, September 1998 , pp. 213-216(4)

Publisher: Elsevier

Selective absorbers based on AlCuFe thin films

Authors: Soni B.P.; Stonecipher M.R.; Jorizzo J.L.; Ball J.; Eisenhammer T.; Mahr A.; Haugeneder A.; Assmann W.

Source: Solar Energy Materials and Solar Cells, Volume 46, Number 1, 1 April 1997 , pp. 53-65(13)

Publisher: Elsevier

Ultrathin layers of rare earth oxides from Langmuir-Blodgett films

Authors: Voit H.; Schurr M.; Hassmann J.; Kugler R.; Tomaschko C.

Source: Thin Solid Films, Volume 307, Number 1, 10 October 1997 , pp. 260-265(6)

Publisher: Elsevier