Search Results

Changes in magnetic flux density around fatigue crack tips

Authors: KIDA, K.; TANABE, H.; OKANO, H.

Source: Fatigue & Fracture of Engineering Materials & Structures, Volume 32, Number 3, March 2009 , pp. 180-188(9)

Publisher: Blackwell Publishing

Length Control and Sharpening of Carbon Nanotube Scanning Probe Microscope Tips Using Carbon Nanotube "Nanoknife"

Authors: Wei, X.L.; Jiang, A.N.; Gao, S.; Chen, Q.

Source: Journal of Nanoscience and Nanotechnology, Volume 9, Number 2, February 2009 , pp. 1258-1262(5)

Publisher: American Scientific Publishers

The effect of test conditions on the sensitivity and resolution of SRET signal response

Authors: Dzib-Pérez, L.; González-Sánchez, J.; Malo, J.M.; Rodríguez, F.J.

Source: Anti-Corrosion Methods and Materials, Volume 56, Number 1, 2009 , pp. 18-27(10)

Publisher: Emerald Group Publishing Limited

Heat conduction analysis of nano-tip and storage medium in thermal-assisted data storage using molecular dynamics simulation

Authors: Liu, X. J.; Yang, J. P.; Yang, Y. W.

Source: Molecular Simulation, Volume 34, Number 1, January 2008 , pp. 57-63(7)

Publisher: Taylor and Francis Ltd

Focussed ion beam machined cantilever aperture probes for near-field optical imaging

Authors: JIN, E.X.; XU, X.

Source: Journal of Microscopy, Volume 229, Number 3, March 2008 , pp. 503-511(9)

Publisher: Blackwell Publishing

Development of Micro Scanning Multiprobes for Material Characterization

Authors: Li, Y.; Zheng, Q.; Wang, Z.; Katragadda, R.; Khalid, W.; Panguluri, R.P.; Nadgorny, B.; Hoffmann, P.M.; Xu, Y.

Source: Sensor Letters, Volume 6, Number 2, April 2008 , pp. 299-304(6)

Publisher: American Scientific Publishers

Simulations of tip-enhanced optical microscopy reveal atomic resolution

Authors: DOWNES, ANDREW; SALTER, DONALD; ELFICK, ALISTAIR

Source: Journal of Microscopy, Volume 229, Number 2, February 2008 , pp. 184-188(5)

Publisher: Blackwell Publishing

Development of apertureless near-field scanning optical microscope tips for tip-enhanced Raman spectroscopy

Authors: KODAMA, T.; UMEZAWA, T.; WATANABE, S.; OHTANI, H.

Source: Journal of Microscopy, Volume 229, Number 2, February 2008 , pp. 240-246(7)

Publisher: Blackwell Publishing

Coupling efficiency of probes in emission-mode scanning near-field optical microscopy

Authors: ALVAREZ, L.; XIAO, M.

Source: Journal of Microscopy, Volume 229, Number 2, February 2008 , pp. 371-376(6)

Publisher: Blackwell Publishing

A Well Defined Electron Beam Source Produced by the Controlled Field Assisted Etchingof Metal Tips to < 1 nm Radius

Authors: Rezeq, Moh'd; Pitters, Jason; Wolkow, Robert

Source: Journal of Scanning Probe Microscopy, Volume 2, Numbers 1-2, June/December 2007 , pp. 1-4(4)

Publisher: American Scientific Publishers

Nanoparticle-terminated scanning probe microscopy tips and surface samples

Authors: Vakarelski, Ivan U.; Brown, Scott C.; Moudgil, Brij M.; Higashitani, Ko

Source: Advanced Powder Technology, Volume 18, Number 6, 2007 , pp. 605-614(10)

Publisher: VSP, an imprint of Brill

Methods for Molecular Nanoanalysis

Authors: Schmid, Thomas; Schmitz, Thomas A.; Setz, Patrick D.; Yeo, Boon-Siang; Zhang, Weihua; Zenobi, Renato

Source: CHIMIA International Journal for Chemistry, Volume 60, Number 11, November 2006 , pp. 783-788(6)

Publisher: Swiss Chemical Society

Characterisation of surface texture using AFM with trimmed probe tip

Authors: Ali, M.Y.; Lim, B.H.

Source: Surface Engineering, Volume 22, Number 6, December 2006 , pp. 443-446(4)

Publisher: Maney Publishing

Measuring the Interaction Force Between a Tip and a Substrate Using a Quartz Tuning Fork Under Ambient Conditions

Authors: Qin, Yexian; Reifenberger, R.

Source: Journal of Nanoscience and Nanotechnology, Volume 6, Number 11, November 2006 , pp. 3455-3459(5)

Publisher: American Scientific Publishers

Modification of single molecule fluorescence by a scanning probe

Authors: Kühn, S.; Sandoghdar, V.

Source: Applied Physics B, Volume 84, Numbers 1-2, July 2006 , pp. 211-217(7)

Publisher: Springer

Fabrication of high-aspect-ratio carbon nanocone probes by electron beam induced deposition patterning

Authors: Chen, I-Chen; Chen, Li-Han; Orme, Christine; Quist, Arjan; Lal, Ratnesh; Jin, Sungho

Source: Nanotechnology, Volume 17, Number 17, 14 September 2006 , pp. 4322-4326(5)

Publisher: Institute of Physics Publishing

A diamond-tip probe with silicon-based piezoresistive strain gauge for high-density data storage using scanning nonlinear dielectric microscopy

Authors: Takahashi, Hirokazu; Ono, Takahito; Onoe, Atsushi; Cho, Yasuo; Esashi, Masayoshi

Source: Journal of Micromechanics and Microengineering, Volume 16, Number 8, August 2006 , pp. 1620-1624(5)

Publisher: Institute of Physics Publishing

Chemomechanical Nanolithography: Nanografting on Silicon and Factors Impacting Linewidth

Authors: Lee, Michael V.; Hoffman, Melinda Tonks; Barnett, Katherine; Geiss, John-Mark; Smentkowski, Vincent S.; Linford, Matthew R.; Davis, Robert C.

Source: Journal of Nanoscience and Nanotechnology, Volume 6, Number 6, June 2006 , pp. 1639-1643(5)

Publisher: American Scientific Publishers

Nanotips: Growth, Model, and Applications

Authors: Chattopadhyay, Surojit; Chen, Li-Chyong; Chen, Kuei-Hsien

Source: Critical Reviews in Solid State and Material Sciences, Volume 31, Numbers 1-2, -2/January-June 2006 , pp. 15-53(39)

Publisher: Taylor and Francis Ltd

On the dissipation of mechanical energy in a noncontact dynamic mode of a scanning probe microscope under vacuum

Author: Dedkov, G.

Source: Physics of the Solid State, Volume 48, Number 4, April 2006 , pp. 747-752(6)

Publisher: MAIK Nauka/Interperiodica