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4 articles with title/keywords/abstract containing GATE LENGTH BIASING

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Statistical Leakage Minimization of Digital Circuits Using Gate Sizing, Gate Length Biasing, and Threshold Voltage Selection

Authors: Bhardwaj, Sarvesh; Cao, Yu; Vrudhula, Sarma

Source: Journal of Low Power Electronics, Volume 2, Number 2, August 2006 , pp. 240-250(11)

Publisher: American Scientific Publishers

An investigation on RF CMOS stability related to bias and scaling

Authors: Su J.-G.; Wong S.-C.; Chang C.-Y.

Source: Solid-State Electronics, Volume 46, Number 4, April 2002 , pp. 451-458(8)

Publisher: Elsevier

Hot-carrier effects in deep submicron SOI MOSFETs

Authors: Renn S.H.; Pelloie J.L.; Balestra F.

Source: Solid-State Electronics, Volume 41, Number 11, November 1997 , pp. 1769-1772(4)

Publisher: Elsevier

Effects of X-ray lithography and irradiation damage on Si-devices

Author: Bhattacharya P.K.

Source: Radiation Physics and Chemistry, Volume 48, Number 5, November 1996 , pp. 669-681(13)

Publisher: Elsevier

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