Search Results

Implantation Induced Hardening of Nanocrystalline Titanium Thin Films

Authors: Krishnan, R.; Amirthapandian, S.; Mangamma, G.; Ramaseshan, R.; Dash, S.; Tyagi, A.K.; Jayaram, V.; Raj, Baldev

Source: Journal of Nanoscience and Nanotechnology, Volume 9, Number 9, September 2009 , pp. 5461-5466(6)

Publisher: American Scientific Publishers

Interface mixing behaviour of Lennard-Jones FCC (100) thin film

Authors: Gazali, Panji; Kwak, Sang Kyu; Singh, Jayant

Source: Molecular Physics, Volume 106, Numbers 21-23, November 2008 , pp. 2417-2423(7)

Publisher: Taylor and Francis Ltd

Fabrication of FePt/M (M = C, Ag, Si) nanoparticulate thin films with perpendicular anisotropy

Authors: Huang, Yunhe; Wan, Jun; Zhang, Yong; Hadjipanayis, George

Source: International Journal of Product Development, Volume 5, Numbers 3-4, 11 March 2008 , pp. 259-267(9)

Publisher: Inderscience Publishers

Growth of highly c-axis oriented aluminum nitride thin films on β-tantalum bottom electrodes

Authors: Akiyama, M.; Ueno, N.; Nagao, K.; Yamada, T.

Source: Journal of Materials Science, Volume 41, Number 14, July 2006 , pp. 4691-4694(4)

Publisher: Springer

A comparison of different methods for x-ray diffraction line broadening analysis of Ti and Ag UHV deposited thin films: nanostructural dependence on substrate temperature and film thickness

Authors: Savaloni, H.; Gholipour-Shahraki, M.; Player, M.A.

Source: Journal of Physics D: Applied Physics, Volume 39, Number 10, 21 May 2006 , pp. 2231-2247(17)

Publisher: Institute of Physics Publishing

Thermal stability of fcc structure in FeNi films of various thicknesses

Author: Gorovoi, A.

Source: Technical Physics Letters, Volume 31, Number 1, January 2005 , pp. 43-45(3)

Publisher: MAIK Nauka/Interperiodica

Behaviour of Ir-24 at.-%Ta films on Ni based single crystal superalloys

Authors: Kuppusami, P.; Murakami, H.; Ohmura, T.

Source: Surface Engineering, Volume 21, Number 1, February 2005 , pp. 53-59(7)

Publisher: Maney Publishing

Electrodeposited L1₀ Co_xPt_1-x nanowires

Authors: J. Mallet; K. Yu-Zhang; S. Mátéfi-Tempfli; M. Mátéfi-Tempfli; L. Piraux

Source: Journal of Physics D: Applied Physics, Volume 38, Number 6, 21 March 2005 , pp. 909-914(6)

Publisher: Institute of Physics Publishing

FePt and CoPt magnetic nanoparticles film for future high density data storage media

Authors: Sun, Xiangcheng; Huang, Yunhe; Nikles, David E.

Source: International Journal of Nanotechnology, Volume 1, Number 3, 26 July 2004 , pp. 328-346(19)

Publisher: Inderscience Publishers

Growth of Al on the Faceted Threefold-Symmetry Surface of the Al-Pd-Mn Quasicrystal

Authors: R. LÜSCHER; T. FLÜCKIGER; M. ERBUDAK

Source: Ferroelectrics, Volume 305, Number 1, 2004 , pp. 245-248(4)

Publisher: Taylor and Francis Ltd

Raman spectra and XPS studies of phase changes in Ge₂Sb₂Te₅ films

Authors: Liu Bo; Song Zhi-Tang; Zhang Ting; Feng Song-Lin; Chen Bomy

Source: Chinese Physics, Volume 13, Number 11, November 2004 , pp. 1947-1950(4)

Publisher: Institute of Physics Publishing

Study on texture evolution and properties of silver thin films prepared by sputtering deposition

Author: Jung Y.S.

Source: Applied Surface Science, Volume 221, Number 1, 15 January 2004 , pp. 281-287(7)

Publisher: Elsevier

Molecular Dynamics simulations of Cu/Ta and Ta/Cu thin film growth

Authors: T.P.C. Klaver; B.J. Thijsse

Source: Journal of Computer-Aided Materials Design, Volume 10, Number 2, 2003 , pp. 61-74(14)

Publisher: Springer

C₆₀ thin-film transistors with high field-effect mobility, fabricated by molecular beam deposition

Authors: Kobayashi S.; Takenobu T.; Mori S.; Fujiwara A.; Iwasa Y.

Source: Science and Technology of Advanced Materials, Volume 4, Number 4, 1 July 2003 , pp. 371-375(5)

Publisher: Elsevier

Synthesis and characterization of chemically deposited lead selenide thin films

Authors: Hankare P.P.; Delekar S.D.; Bhuse V.M.; Garadkar K.M.; Sabane S.D.; Gavali L.V.

Source: Materials Chemistry and Physics, Volume 82, Number 3, 20 December 2003 , pp. 505-508(4)

Publisher: Elsevier

The influence of the deposition temperature and substrate on the properties of FePt thin films

Authors: Martins A.; Fantini M.C.A.; Santos A.D.

Source: Journal of Magnetism and Magnetic Materials, Volume 265, Number 1, September 2003 , pp. 13-22(10)

Publisher: Elsevier

Growth of Ag thin films on complex surfaces of quasicrystals and approximant phases

Authors: Fournee V.; Ross A.R.; Lograsso T.A.; Evans J.W.; Thiel P.A.

Source: Surface Science, Volume 537, Number 1, 1 July 2003 , pp. 5-26(22)

Publisher: Elsevier

Characterization of PdAu thin films on oxidized silicon wafers: interdiffusion and reaction

Authors: Yalcin S.; Avci R.

Source: Applied Surface Science, Volume 214, Number 1, 31 May 2003 , pp. 319-337(19)

Publisher: Elsevier

Formation of oriented silver telluride on single and polycrystalline Ag films

Authors: Safran G.; Geszti O.; Radnoczi G.

Source: Vacuum, Volume 71, Number 1, 9 May 2003 , pp. 299-305(7)

Publisher: Elsevier

The effects of Ag underlayer and Pt intermediate layers on the microstructure and magnetic properties of epitaxial FePt thin films

Authors: Hsu Y.-N.; Jeong S.; Laughlin D.E.; Lambeth D.N.

Source: Journal of Magnetism and Magnetic Materials, Volume 260, Number 1, March 2003 , pp. 282-294(13)

Publisher: Elsevier