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Home / Sensor Letters, Volume 7, Number 3

Investigation of Artificial Cracks by Scanning SQUID Magnetic Microscope

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Authors: Adamo, M.; Bonavolontà, C.; Valentino, M.; Sarnelli, E.

Source: Sensor Letters, Volume 7, Number 3, June 2009, pp. 397-399(3)

Publisher: American Scientific Publishers

DOI: https://doi.org/10.1166/sl.2009.1051

We have investigated deep defects in structural Al-Ti alloy planar samples used in aeronautical application, by means of eddy current Non-Destructive Evaluation (NDE). The experimental system is a Scanning Magnetic Microscope (SMM) equipped with a high-critical temperature (HTc) dc Superconducting Quantum Interference Device (SQUID) magnetometer characterized by field sensitivity of 20 pT/(Hz)1/2 and spatial resolution of about 50 m. We have detected cracks several millimeters below the surface, keeping relatively high spatial resolution. By mapping the magnetic field distribution, we can localize the sub-surface crack position. The experimental results confirm that this system could be used to detect defects with high resolution for the modeling of fatigue cracks in structures of aeronautical interest.

Keywords: EDDY-CURRENT; HTC DC SQUID MAGNETOMETER; NON-DESTRUCTIVE EVALUATION (NDE); SCANNING MAGNETIC MICROSCOPE (SMM)

Document Type: Research Article

Publication date: 01 June 2009

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