Influence of Interaction Between Fiber Probe and Sample Surface on Near-Field Probing of Plasmonic Structures
The interaction and perturbation of evanescent fields originating from both facet of a metal-coated fiber probe and surface of a plasmonic structure were analyzed numerically using finite-difference and time-domain (FDTD) algorithm. The simulation model consists of a plasmonic lens and a metal-coated fiber probe scanning in tipping mode at constant working distance. Influences of the scanning height and lateral detecting position of the fiber probe were discussed on the basis of the computational numerical calculation results. Relationship between the measured electric field intensity and the original field intensity of the plasmonic structure without perturbation of the probe is compared and analyzed by means of both theoretical computation and focused ion beam (FIB) nanofabrication and near-field scanning optical microscope (NSOM) characterization-based experimental study. Our results reveal that when the scanning height h is applicable (40 nm < h < 80 nm), the measured field intensity distribution shows a better similarity with the original intensity distribution without the interaction and perturbation, i.e., the NSOM results can describe the original distribution accurately. In addition, the interaction and perturbation only affects electric field intensity, but no influence on phase distribution of the plasmonic structures.
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Document Type: Research Article
Publication date: 2013-08-01
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