Optical Features of Noble-Metal-Oxide Thin Films Under Irradiation of Blue Laser
The optical reflectance and transmittance of Platinum oxide (PtO
x
) and palladium oxide (PdO
x
) thin films for ultrahigh-density optical storage are investigated using Z-scan technique under irradiation of blue laser (442 nm). The power thresholds of
the PtO
x
and PdO
x
decomposition, 3.1 mW and 2.6 mW, are obtained respectively; the PtO
x
(PdO
x
) thin film is reversible and irreversible when input power is less than and more than 3.1 mW (2.6 mW). Deformation analyses
by using an atom force microscope (AFM), which is formed in the micro irradiation region of surface on the thin film samples due to decomposition of the PtO
x
or PdO
x
driving the Z-scan, agree well with the Z-scan results. The optical features obtained at
442-nm wavelength are compared with those at 532-nm wavelength, and the threshold difference between the two wavelengths is also analysed in detail based on wavelength-dependent average power density and wavelength-selected absorption of the thin films.
Keywords: OPTICAL PROPERTY; SUPER-RENS; THIN FILM
Document Type: Research Article
Publication date: 01 January 2007
- Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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