Skip to main content

On the Modeling of Inflow and Infiltration Within Sanitary Collection Systems for Addressing Nonlinearities Arising from Antecedent Moisture Conditions

The full text article is not available for purchase.

The publisher only permits individual articles to be downloaded by subscribers.

or click here to sign up for a free trial


The deterioration of sanitary collection systems results in increased storm water and clear-water entering the system through inflow and infiltration (I&I). These systems are often not designed to handle the resulting wet weather flow rates caused by I&I. The effectiveness of improvements in sanitary infrastructure relating to I&I depends entirely on the ability to accurately forecast I&I response. Currently, there are no modeling tools available that specifically model I&I within sanitary collection systems. Thus, the ability to accurately forecast I&I response and make effective recommendations for sanitary collection system improvements is currently limited.

Document Type: Research Article


Publication date: January 1, 2001

More about this publication?
  • Proceedings of the Water Environment Federation is an archive of papers published in the proceedings of the annual Water Environment Federation® Technical Exhibition and Conference (WEFTEC® ) and specialty conferences held since the year 2000. These proceedings are not peer reviewed.

    WEF Members: Sign in (right panel) with your IngentaConnect user name and password to receive complimentary access.
  • Subscribe to this Title
  • Membership Information
  • About WEF Proceedings
  • WEFTEC Conference Information
  • Ingenta Connect is not responsible for the content or availability of external websites

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more