Preparation and femtosecond non-linear optical properties of Ag/SiO₂ composite thin films

Authors: Tanahashi, Ichiro; Inouye, Hideyuki; Mito, Akihiro

Source: Research on Chemical Intermediates, Volume 29, Numbers 7-9, 2003 , pp. 939-946(8)

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Abstract:

Ag nanoparticles embedded in SiO₂ thin films (Ag/SiO₂ films) were prepared by a multitarget sputtering method. In the optical absorption spectra of the Ag/SiO₂ films, the absorption peak due to the surface plasmon resonance (SPR) of Ag particle was clearly observed at the wavelength of 394–413 nm. The imaginary part of the third-order non-linear susceptibility, Im[χ⁽³⁾], of the Ag/SiO₂ film was estimated to be −1.1 × 10⁻⁸ esu measured by the femtosecond Z-scan technique near the SPR peak. The response time of the film measured from the decay of the differential transmission of the pump-probe experiment was 1.3 ps at the SPR peak.

Keywords: OPTICAL NON-LINEARITY; THIN FILM; AG PARTICLE

Document Type: Research article

DOI: http://dx.doi.org/10.1163/156856703322601924

Publication date: 2003-07-01