Use of a phase type elongated circular grating in Talbot moiré deflectometry

Authors: Kim, B J.¹; Yuk, K C.¹; Lee, S I.²; Chang, S²

Source: Optik – International Journal for Light and Electron Optics, Volume 115, Number 3, June 2004 , pp. 121-128(8)

Publisher: Urban & Fischer

Buy & download fulltext article:

Price: $28.55 plus tax (Refund Policy)

Abstract:

We analyze theoretically and experimentally the self-image of a phase type elongated circular (EC) grating which has a periodic structure of rectangular type, so that it can be employed in Talbot moiré deflectometry. We examine the visibility of a self-imaged phase EC grating while the optical phase difference of the grating is varied. We show that the self-image of a phase EC grating of rectangular type is slightly aberrated around the center of the interface of linear and semicircular parts but moiré fringes by self-imaging a phase EC grating on a reference EC grating are little influenced by the image aberration. We conclude that a phase EC grating as well as an amplitude EC grating in our earlier work [Optik 113 (2002) 285] can be effectively applied to a Talbot interferometer when the phase difference of the grating is prepared close to 90°.

Document Type: Research article

DOI: http://dx.doi.org/10.1078/0030-4026-00340

Affiliations: 1: Department of Physics Education, Kongju National University, 182, Sinkwandong, Kongju, Korea 2: Department of Physics, Hannam University, 133 Ojungdong, Taejon 306-791, Korea

Publication date: 2004-06-01