Sensitivity of current to energy in scanning tunneling microscopy within the vacuum case

Authors: Grado-Caffaro, M A.; Grado-Caffaro, M

Source: Optik – International Journal for Light and Electron Optics, Volume 114, Number 12, March 2004 , pp. 567-568(2)

Publisher: Urban & Fischer

Buy & download fulltext article:

Price: $29.27 plus tax (Refund Policy)

Abstract:

Sensitivity of the tunneling current to electron energy is calculated in the context of scanning tunneling microscopy for the vacuum case by using an appropriate parameter. In addition, a mathematical relationship between this parameter and the phase associated with the involved Schrödinger wavefunctions is obtained.

Document Type: Research article

DOI: http://dx.doi.org/10.1078/0030-4026-00313

Affiliations: 1: SAPIENZA S. L. (scientific consultants), C/Julio Palacios 11, 9-B, 28029-Madrid, Spain

Publication date: 2004-03-01