Optik – International Journal for Light and Electron Optics

Optical properties filtering using Mueller's formalism: Application to laser imaging
pp. 289-297(9)
Authors: Guyot, S; Vézien, C; Clairac, B; Fontas, B

A matrix method for calculating the three-dimensional irradiance distribution in the focal region of a convergent beam
pp. 298-304(7)
Authors: Cooper, I J.; Sheppard, R C.

Restricted equivalence of paired epsilon-negative and mu-negative layers to a negative phase-velocity material (alias left-handed material)
pp. 305-307(3)
Authors: Lakhtakia, Akhlesh; Krowne, Clifford M.

Partially polarized multi-Gaussian Schell-model beams and their characterization in use of the Wigner distribution function
pp. 308-316(9)
Authors: Lü, Baida; Li, Bingzhong

A method of improving spatial resolution in X-ray fluorescence holography
pp. 317-321(5)
Authors: Xie, Honglan; Chen, Jianwen; Gao, Hongyi; Xiong, Shisheng; Xu, Zhizhan

Experimental demonstration of all-optical SOA-assisted Sagnac recirculating shift register with an inverter and SOA feedback
pp. 322-328(7)
Authors: Houbavlis, T; Zoiros, K E.

Binary phase-only pupil filters application to high-aperture confocal microscopy
pp. 329-332(4)
Authors: Lin, Lie; Wang, Xianghui; Wang, Zhaoqi; Mu, Guoguang

Wide angle near-field diffraction and Wigner distribution
pp. 333-335(3)
Authors: Almeida, José B.; Lakshminarayanan, Vasudevan