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A computer algebra approach to imaging and Seidel aberrations in spherical refracting surfaces of revolution and thin lenses

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A self-contained introduction to imaging and third order Seidel aberrations in simple optical systems is presented using the analytical approach to find the refracted ray in a form which can be either calculated numerically or developed in series by means of modern computer algebra programs. In this way the paraxial equations, as well as the third order Seidel aberration coefficients, can be easily obtained as the computer take care of the otherwise boring and error prone calculus work.

Document Type: Research Article


Affiliations: Department of Physics and Istituto Nazionale per la Fisica della Materia, University of Bologna, Viale B. Pichat 6/2, 40127 Bologna, Italy

Publication date: 2003-04-01

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