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Evaluation of a total reflection set-up by an interface geometric model

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We have studied the total reflection regime through a model represented by a region separating two dielectric bulk media with well-defined refraction indexes. This region is considered to be an interface in which the following hypotheses are established: – Refraction index linear variation with the transition from one medium to the other. – The thickness depends on the optical phenomenon supposedly produced in the interface. The results we obtained were in close agreement with those obtained by authors who have studied this regime through a fundamentally different treatment.

Document Type: Research Article


Affiliations: IES Juan Carlos I, C/San Francisco s/n, 28350 Ciempozuelos (Madrid), Spain

Publication date: 2003-03-01

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