Optical characterization of thin layers according to the confinement model
Authors: Delgado, M.; Delgado, E.
Source: Optik International Journal for Light and Electron Optics, Volume 113, Number 6, 1 September 2002 , pp. 251-259(9)
Publisher: Urban & Fischer
Abstract:Using optical methods, the main optical parameters characterizing a very thin dielectric layer were obtained simultaneously. A confinement model was used, which simplified comprehension of the optical behaviour of these layers.
Document Type: Original article
Publication date: 2002-09-01