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Optical characterization of thin layers according to the confinement model
Authors: Delgado, M.; Delgado, E.
Source: Optik – International Journal for Light and Electron Optics, Volume 113, Number 6, 1 September 2002 , pp. 251-259(9)
Publisher: Urban & Fischer
Abstract:
Using optical methods, the main optical parameters characterizing a very thin dielectric layer were obtained simultaneously. A confinement model was used, which simplified comprehension of the optical behaviour of these layers.Keywords: Confinement model; reflectance; optical functions
Document Type: Original article
DOI: http://dx.doi.org/10.1078/0030-4026-00161
Affiliations: 1: IES Juan Carlos I, C/San Francisco s/n, 28350 Ciempozuelos (Madrid), Spain
Publication date: 2002-09-01
- In this: publication
- By this: publisher
- In this Subject: Optics & Light
- By this author: Delgado, M. ; Delgado, E.
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