If you are experiencing problems downloading PDF or HTML fulltext, our helpdesk recommend clearing your browser cache and trying again. If you need help in clearing your cache, please click here . Still need help? Email help@ingentaconnect.com

Optical characterization of thin layers according to the confinement model

$30.41 plus tax (Refund Policy)

Buy Article:

Abstract:

Using optical methods, the main optical parameters characterizing a very thin dielectric layer were obtained simultaneously. A confinement model was used, which simplified comprehension of the optical behaviour of these layers.

Keywords: Confinement model; optical functions; reflectance

Document Type: Original Article

DOI: http://dx.doi.org/10.1078/0030-4026-00161

Affiliations: IES Juan Carlos I, C/San Francisco s/n, 28350 Ciempozuelos (Madrid), Spain

Publication date: September 1, 2002

Related content

Tools

Favourites

Share Content

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
X
Cookie Policy
ingentaconnect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more