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Optical characterization of thin layers according to the confinement model

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Using optical methods, the main optical parameters characterizing a very thin dielectric layer were obtained simultaneously. A confinement model was used, which simplified comprehension of the optical behaviour of these layers.

Keywords: Confinement model; optical functions; reflectance

Document Type: Original Article

DOI: http://dx.doi.org/10.1078/0030-4026-00161

Affiliations: IES Juan Carlos I, C/San Francisco s/n, 28350 Ciempozuelos (Madrid), Spain

Publication date: September 1, 2002

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