Author: Khursheed, A.
Source: Optik International Journal for Light and Electron Optics, Volume 113, Number 2, 1 April 2002, pp. 67-77(11)
Publisher: Urban & Fischer
Keywords: Low voltage scanning electron microscopy
Document Type: Original Article
Affiliations: Department of Electrical Engineering, National University of Singapore, 10 Kent Ridge Crescent, Singapore 119260
Publication date: April 1, 2002