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A quick estimation of the LEED pattern size formed by an electrostatic objective lens in LEEM

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A formula for a quick estimation of the size of the low energy electron diffraction (LEED) pattern formed by an electrostatic objective lens of a low energy electron microscope (LEEM) is derived. Through the analytic calculation for an approximate solution for an emergence trajectory, we show that the radius of this LEED pattern is roughly equal to the object side focal length of the objective lens

Keywords: Electron optics; electron microscopy; low energy electron diffraction; low energy electron microscopy

Document Type: Original Article


Affiliations: Laboratory for Physical Sciences, Department of Physics and Department of Material and Nuclear Engineering, University of Maryland, College Park, MD 20740, USA

Publication date: 2002-01-01

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