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Generation of two-dimensional surface profiles from differential interference contrast (DIC) — images

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Abstract:

Generation of two-dimensional surface profiles from differential interference contrast (DIC) – images. High quality optical systems require polished optical glasses with remaining roughness smaller than 0.5 nm. To test such surfaces, we need measurement methods which are based on quantitative imaging. The following article will develop such a method.

Keywords: Quantitative DIC-Microscopy; polished glass; surface roughness

Document Type: Original Article

DOI: http://dx.doi.org/10.1078/0030-4026-00063

Affiliations: Optisches Institut, Technische Universit├Ąt Berlin, Secr. P1-1, Strasse des 17. Juni 135 10623 Berlin, Germany

Publication date: October 1, 2001

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