If you are experiencing problems downloading PDF or HTML fulltext, our helpdesk recommend clearing your browser cache and trying again. If you need help in clearing your cache, please click here . Still need help? Email help@ingentaconnect.com

Spectroscopic ellipsometry characterization of Er3+-dopedtitania thin films prepared by the sol-gel method

$30.41 plus tax (Refund Policy)

Buy Article:

Abstract:

Abstract: Titania thin films prepared by the sol-gel method were optically characterized by spectroscopic ellipsometry. These films were doped with Er3+ and supported on silicon wafers chemically activated by using the dipping method. The dielectric function was modeled using the Forouhi-Bloomer model, which provides also the refractive index and the thickness of the film.

Keywords: Sol-gel method; ellipsometry; film characterization; thin films

Document Type: Original Article

DOI: http://dx.doi.org/10.1078/0030-4026-00054

Affiliations: 1: Factultad Ciencias Físico-Matemáticas, BUAP, Apdo. Postal 1152, Puebla, México 2: CINVESTAV-IPN, Unidad Querétaro, Apdo. Postal 1-798, 76010, Querétaro, México 3: Instituto de Física, BUAP, Apdo. Postal J-48, 72570, Puebla, México 4: Instituto de Física, UNAM, Apdo. Postal 1-1010, Querétaro, México

Publication date: July 1, 2001

Related content

Tools

Favourites

Share Content

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
X
Cookie Policy
ingentaconnect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more