Spectroscopic ellipsometry characterization of Er3+-dopedtitania thin films prepared by the sol-gel method
Abstract:Abstract: Titania thin films prepared by the sol-gel method were optically characterized by spectroscopic ellipsometry. These films were doped with Er3+ and supported on silicon wafers chemically activated by using the dipping method. The dielectric function was modeled using the Forouhi-Bloomer model, which provides also the refractive index and the thickness of the film.
Document Type: Original Article
Affiliations: 1: Factultad Ciencias Físico-Matemáticas, BUAP, Apdo. Postal 1152, Puebla, México 2: CINVESTAV-IPN, Unidad Querétaro, Apdo. Postal 1-798, 76010, Querétaro, México 3: Instituto de Física, BUAP, Apdo. Postal J-48, 72570, Puebla, México 4: Instituto de Física, UNAM, Apdo. Postal 1-1010, Querétaro, México
Publication date: June 1, 2001