Surface roughness effects in dual beam illumination speckle interferometers: Theoretical study

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Abstract:

Abstract: Analyzed in this paper is the influence of surface roughness of the object on the quality of data or fringes obtained in dual beam illumination speckle interferometers. The theoretical analysis is based on the electromagnetic scattering of light from rough surfaces by observing the modulation of the speckles in the dual beam illumination speckle interferometric setup. It is shown that when object surface roughness is greater than the wavelength of light the quality of the signal is dependent on the angle of illumination of the beam and also on the observation direction. Both in-plane and out-of-plane sensitive dual beam illumination interferometers are investigated in this paper. We show that in one specific arrangement the modulation of the speckles is dependent on the surface roughness of the object being investigated.

Keywords: Interferometry; speckle interferometry; speckle phenomena; surface roughness

Document Type: Original Article

DOI: http://dx.doi.org/10.1078/0030-4026-00034

Affiliations: 1: Department of Physics and Applied Optics, Rose-Hulman Institute of Technology, 5500 Wabash Avenue, Terre Haute, IN 478023, USA 2: Centro de Investigaciones Opticas (CIOp) and OPTIMO, Faculty of Engineering, La Plata University, P.O. Box 124, (1900) La Plata, Argentina 3: Departamento de Fisica, Universitad de Antioquia, A.A 1216, Medellin, Colombia

Publication date: April 1, 2001

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