Skip to main content

Depth resolution of a laser profilometer based on photo-EMF detector

Buy Article:

$26.36 plus tax (Refund Policy)

Abstract: A laser profilometer based on adaptive photo-EMF detector that can find application for testing optically rough surfaces is described. Depth resolution of the configuration is shown to depend on not only the coherence length of the wide-spectrum light source used, but also the interelectrode spacing of the detector and crossing angle of interfering beams. Experimental demonstration of the device having an approximately 10 mm resolution and using a GaAs photo-EMF detector and a superluminescent diode was performed in tests of multisurface reflecting object.
No Reference information available - sign in for access.
No Citation information available - sign in for access.
No Supplementary Data.
No Data/Media
No Metrics

Keywords: Coherence; photo-EMF effect; topometry

Document Type: Original Article

Affiliations: Instituto Nacional de Astrofísica, Óptica y Electrónica – INAOE, Ap. Post. 51 y 216, 72000, Puebla, México

Publication date: 2001-04-01

  • Access Key
  • Free content
  • Partial Free content
  • New content
  • Open access content
  • Partial Open access content
  • Subscribed content
  • Partial Subscribed content
  • Free trial content
Cookie Policy
X
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more