Home >> Optik – International Journal for Light and Electron Optics, Volume 112, Number 2

Etendue invariance in speckle fields

Authors: Medina F.F.1; García-Sucerquia J.1; Henao R.1; Trivi M.2; Castaneda R.3

Source: Optik – International Journal for Light and Electron Optics, Volume 112, Number 2, February 2001 , pp. 57-61(5)

Publisher: Urban & Fischer

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Abstract:

Experimental evidence is shown that confirms the Etendue invariance in speckle fields. Because of this condition, the coherence patch of the speckle field can be significantly greater than the mean size of the speckles, as is shown by double exposure speckle interferometry.

Keywords: Speckle pattern; double exposure; cross-spectral density; Young's interference

Language: English

Document Type: Original article

DOI: http://dx.doi.org/10.1078/0030-4026-00010

Affiliations: 1: Physics Department, Universidad de Antioquia, A. A. 1226, Medellín, Colombia 2: Centro de Investigaciones Opticas, CIOp Casilla de Correo 124, 1600 La Plata, Argentina 3: Physics Department, Universidad Nacional de Colombia A. A. 3840, Medellín, Colombia

Publication date: 2001-02-01

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