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Publisher: Taylor and Francis Ltd

Volume 4, Number 1, 1 January 2000
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NOMENCLATURE LIST
pp. 3-6(4)

INTERPRETATION OF OPTICAL DIAGNOSTICS FOR THE ANALYSIS OF LASER CRYSTALLIZATION OF AMORPHOUS SILICON FILMS
pp. 25-38(14)
Authors: Moon S.; Lee M.; Hatano M.; Grigoropoulos C. P.

ENERGY CONVERSION IN HETEROSTRUCTURES FOR THERMIONIC COOLING
pp. 39-50(12)
Authors: Zeng T.; Chen G.

THERMAL BOUNDARY RESISTANCE MEASUREMENTS USING A TRANSIENT THERMOREFLECTANCE TECHNIQUE
pp. 51-60(10)
Authors: Smith A. N.; Hostetler J. L.; Norris P. M.

SUBPICOSECOND LASER PROCESSING OF POLYCRYSTALLINE SILICON MICROSTRUCTURES
pp. 61-75(15)
Authors: Phinney L. M.; Fushinobu K.; Tien C-L.

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