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Publisher: Taylor and Francis Ltd

Volume 43, Number 4, April 2011

A physical-statistical model for density control of nanowires
pp. 233-241(9)
Authors: Dasgupta, Tirthankar; Weintraub, Benjamin; Joseph, V. Roshan

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Bayesian hierarchical model for combining misaligned two-resolution metrology data
pp. 242-258(17)
Authors: Xia, Haifeng; Ding, Yu; Mallick, Bani

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Detecting and diagnosing covariance matrix changes in multistage processes
pp. 259-274(16)
Authors: Li, Yanting; Tsung, Fugee

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Multivariate Cuscore control charts for monitoring the mean vector in autocorrelated processes
pp. 291-307(17)
Authors: Chen, Shuohui; Nembhard, Harriet Black

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