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Publisher: Taylor and Francis Ltd

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Volume 41, Number 9, September 2009

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Foreword
pp. 743-743(1)
Authors: Lu, Jye-Chyi; Shi, Jianjun; Tsui, Kwok-Leung; Zhou, Shiyu

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Quality control and improvement for multistage systems: A survey
pp. 744-753(10)
Authors: Shi, Jianjun; Zhou, Shiyu

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A Bayesian parallel site methodology with an application to uniformity modeling in semiconductor manufacturing
pp. 754-763(10)
Authors: Fenner, Joel; Jeong, Young-Seon; Jeong, Myong; Lu, Jye-Chyi

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A chart allocation strategy for multistage processes
pp. 790-803(14)
Authors: Jin, Ming; Tsung, Fugee

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Optimal fixture locator adjustment strategies for multi-station assembly processes
pp. 843-852(10)
Authors: Chaipradabgiat, Thavanrath; Jin, Jionghua; Shi, Jianjun

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