ISSN 0740-817X (Print); ISSN 1545-8830 (Online)
Publisher: Taylor and Francis Ltd
Yield prediction via spatial modeling of clustered defect counts across a wafer map pp. 1073-1083(11) Authors: Bae, Suk Joo; Hwang, Jung Yoon; Kuo, Way
Integrated reconfiguration and age-based preventive maintenance decision making pp. 1085-1102(18) Authors: Zhou, Jing; Djurdjanovic, Dragan; Ivy, Julie; Ni, Jun
Determining the number of operational modes in baseline multivariate SPC data pp. 1103-1110(8) Authors: Zhang, Hang; Albin, Susan
Maintenance scheduling for a manufacturing system of machines with adjustable throughput pp. 1111-1125(15) Authors: Yang, Zimin; Djurdjanovic, Dragan; Ni, Jun
Design of EWMA and CUSUM control charts subject to random shift sizes and quality impacts pp. 1127-1141(15) Authors: Chen, Argon; Chen, Y. K.
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