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Publisher: Taylor and Francis Ltd

Volume 39, Number 12, December 2007

Yield prediction via spatial modeling of clustered defect counts across a wafer map
pp. 1073-1083(11)
Authors: Bae, Suk Joo; Hwang, Jung Yoon; Kuo, Way

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Integrated reconfiguration and age-based preventive maintenance decision making
pp. 1085-1102(18)
Authors: Zhou, Jing; Djurdjanovic, Dragan; Ivy, Julie; Ni, Jun

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Determining the number of operational modes in baseline multivariate SPC data
pp. 1103-1110(8)
Authors: Zhang, Hang; Albin, Susan

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Maintenance scheduling for a manufacturing system of machines with adjustable throughput
pp. 1111-1125(15)
Authors: Yang, Zimin; Djurdjanovic, Dragan; Ni, Jun

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