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Publisher: Taylor and Francis Ltd

Volume 36, Number 12, December 2004

Optimal burn-in policy by using an integrated Wiener process
pp. 1161-1170(10)
Authors: TSENG, SHENG-TSAING; PENG, CHIEN-YU

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Allocating solder-paste printing inspection in high-volume electronics manufacturing
pp. 1171-1181(11)
Authors: Valenzuela, Jorge; Smith, Jeffrey; Evans, John

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A model for correlated failures in N-version programming
pp. 1183-1192(10)
Authors: DAI, Y.S.; XIE, M.; POH, K.L.; NG, S.H.

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S-shaped software reliability growth models derived from stochastic differential equations
pp. 1193-1199(7)
Authors: Lee, Chong; Kim, Yoon; Park, Dong

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Regression and ANOVA: An Integrated Approach Using SAS Software
pp. 1211-1212(2)
Authors: Muller, K.; Fetterman, B.; Brocklebank, J.; Dickey, D.; Joglekar, Anand; Sayed, Ali; Dubin, Daniel

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