IIE Transactions

TECHNICAL NOTE: Nonparametric estimation and variate generation for a nonhomogeneous Poisson process from event count data
pp. 1155-1160(6)
Author: LAWRENCE LEEMIS

Optimal burn-in policy by using an integrated Wiener process
pp. 1161-1170(10)
Authors: SHENG-TSAING TSENG; CHIEN-YU PENG

Allocating solder-paste printing inspection in high-volume electronics manufacturing
pp. 1171-1181(11)
Authors: Jorge Valenzuela; Jeffrey Smith; John Evans

A model for correlated failures in N-version programming
pp. 1183-1192(10)
Authors: Y.S. DAI; M. XIE; K.L. POH; S.H. NG

S-shaped software reliability growth models derived from stochastic differential equations
pp. 1193-1199(7)
Authors: Chong Lee; Yoon Kim; Dong Park

A joint monitoring scheme for automatically controlled processes
pp. 1201-1210(10)
Author: WEI JIANG

Regression and ANOVA: An Integrated Approach Using SAS Software
pp. 1211-1212(2)
Authors: K. Muller; B. Fetterman; J. Brocklebank; D. Dickey; Anand Joglekar; Ali Sayed; Daniel Dubin