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Publisher: Taylor and Francis Ltd

Volume 36, Number 9, September 2004

Wavelet-based multiscale statistical process monitoring: A literature review
pp. 787-806(20)
Authors: GANESAN, RAJESH; DAS, TAPAS; VENKATARAMAN, VIVEKANAND

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Inspection schemes for general systems
pp. 817-825(9)
Authors: CUI, LIRONG; XIE, MIN; LOH, HAN-TONG

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Cumulative conformance count chart with sequentially updated parameters
pp. 841-853(13)
Authors: TANG, LOON; CHEONG, WEE

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A likelihood-ratio-based EWMA control chart for monitoring variability of multivariate normal processes
pp. 865-879(15)
Authors: YEH, ARTHUR; HUWANG, LONGCHEEN; WU, YU-FANG

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Redundancy allocation for series-parallel systems using a max-min approach
pp. 891-898(8)
Authors: RAMIREZ-MARQUEZ, JOSE; COIT, DAVID; KONAK, ABDULLAH

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Random Processes: Filtering, Estimation, and Detection
pp. 913-914(2)
Authors: Luderman, Lonnie; Murguia, Mario

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