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Rigorous Simulation and Analysis of Semiconductor Laser Dynamics Taking Multiple Reflections in the External Cavity into Account

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This paper presents a numerical method to obtain, through statistically correct simulation from a set of improved nonlinear stochastic rate equations, a rigorous description of laser dynamics taking multiple reflections in the external cavity into account. From the stochastic rate equations, expressions for the relative intensity noise and frequency noise spectra, taking into account all Langevin noise sources, are presented and utilized to validate the simulation method. It is shown that the main features of the five regimes of feedback effects introduced by Tkach and Chraplyvy, and of other effects, are properly obtained using the numerical simulator presented in this paper.

Keywords: EXTERNAL CAVITY; FREQUENCY NOISE; INTENSITY NOISE; LASER DYNAMICS; LASERS; OPTICAL FEEDBACK; OPTO-ELECTRONICS; SEMICONDUCTOR DEVICE NOISE

Document Type: Research Article

Publication date: 01 May 2001

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