A CASE-BASED REASONING APPROACH TO THE IDENTIFICATION OF MATERIALS FROM DIFFRACTION PATTERNS

Authors: Kimmel, Giora¹; HaCohen-Kerner, Yaakov²; Nissan, Ephraim³; Berman, Eugen¹

Source: Applied Artificial Intelligence, Volume 23, Number 3, March 2009 , pp. 282-295(14)

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Abstract:

X-ray diffractometry, within materials engineering, is a promising area of application for case-based reasoning. A large database of spectral diffraction patterns includes entries with different quality marks; moreover, several diffraction patterns happen to be equivalent, identifying the same material (crystalline phase), even though it also happens, that a spectral diffraction pattern alone would not identify a crystalline phase, and parameters such as density also have to be involved for identification. Current practice in the scanning and processing of so-called powder diffraction files, out of a database of files (formerly cards), calls for improvements of various kinds. Arguably, case-based reasoning is a technique from within AI that appears to exhibit a very interesting potential to make the process of identification less cumbersome.

Document Type: Research article

DOI: http://dx.doi.org/10.1080/08839510802700185

Affiliations: 1: Institutes for Applied Research, Ben-Gurion University of the Negev, Beer-Sheva, Israel 2: Department of Computer Science, Jerusalem College of Technology (Machon Lev), Jerusalem, Israel 3: Department of Computing, Goldsmiths' College, University of London, London, UK

Publication date: 2009-03-01

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