Response of reflectance to dielectric properties of bare tills
Abstract:Parent tills are routinely exposed as a result of mechanical sitepreparation during post-harvest forest regeneration in northern Fennoscandia. Scots pine (Pinus sylvestris L.), the species most often chosen for artificial reforestation, only thrives on sites with low soil moisture content (v). Hence objective methods are needed to measure v of bare tills to provide information on suitability of a site for pine. We studied the relationship between the spectral reflectance (350-2500 nm) and dielectric permittivity (, as dependent on the soil v) of tills varying in clay fraction content (2.4-5.5%), fine fraction content (23.5-47.1%) and organic matter content (OMC, 0.6-5.8%). Laboratory measured data, analysed with correlation and regression analysis and mixed effect modelling, showed a significant negative correlation between reflectance (500-2500 nm) and the soil (i.e. soil v). In addition, the proposed generic exponential models (y=aebx+c) explained the reflectance-soil relationship well (adjusted goodness of fit 0.8-0.85) for tills with low OMC (<1.7%). The results suggest that high-resolution remotely sensed data can provide an effective alternative to traditional soil surveys for recognition of soil v patterns on clear-cut mechanically prepared sites.
Document Type: Research Article
Publication date: February 1, 2004