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Publisher: Taylor and Francis Ltd

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Volume 50, Number 23, 1 December 2012

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A Bayesian network approach for fixture fault diagnosis in launch of the assembly process
pp. 6655-6666(12)
Authors: Jin, Sun; Liu, Yinhua; Lin, Zhongqin

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A multi-model approach to determine early manufacturing parameters for small-data-set prediction
pp. 6679-6690(12)
Authors: Li, Der-Chiang; Liu, Chiao-Wen; Chen, Wen-Chih

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The optimisation of maintenance service levels to support the product service system
pp. 6691-6708(18)
Authors: Kuo, Tsai Chi; Wang, Miao Ling

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A freeform surface manufacturing approach by integration of inspection and tool path generation
pp. 6709-6725(17)
Authors: Lasemi, Ali; Xue, Deyi; Gu, Peihua

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DEA cross-efficiency aggregation method based upon Shannon entropy
pp. 6726-6736(11)
Authors: Wu, Jie; Sun, Jiasen; Liang, Liang

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Estimation of reliability and validity of agility constructs using structural equation modelling
pp. 6737-6745(9)
Authors: Vinodh, S.; Aravindraj, S.; Pushkar, Bala; Kishore, Sanjay

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Performance evaluation of In-Deep Class Storage for Flow-Rack AS/RS
pp. 6775-6791(17)
Authors: Cardin, Olivier; Castagna, Pierre; Sari, Zaki; Meghelli, Nihad

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Robot selection using a fuzzy regression-based decision-making approach
pp. 6826-6834(9)
Authors: Karsak, E. Ertugrul; Sener, Zeynep; Dursun, Mehtap

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Quality and exposure control in semiconductor manufacturing. Part I: Modelling
pp. 6835-6851(17)
Authors: Bettayeb, Belgacem; Bassetto, Samuel; Vialletelle, Philippe; Tollenaere, Michel

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Quality and exposure control in semiconductor manufacturing. Part II: Evaluation
pp. 6852-6869(18)
Authors: Bettayeb, Belgacem; Bassetto, Samuel; Vialletelle, Philippe; Tollenaere, Michel

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Joint optimisation of maintenance and production policies considering random demand and variable production rate
pp. 6870-6885(16)
Authors: Ayed, Souheil; Sofiene, Dellagi; Nidhal, Rezg

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Employing dependent virtual samples to obtain more manufacturing information in pilot runs
pp. 6886-6903(18)
Authors: Li, Der-Chiang; Chen, Chien-Chih; Chen, Wen-Chih; Chang, Che-Jung

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A quantitative method for Failure Mode and Effects Analysis
pp. 6904-6917(14)
Authors: Braaksma, A.J.J.; Meesters, A.J.; Klingenberg, W.; Hicks, C.

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Condition based maintenance in the context of opportunistic maintenance
pp. 6918-6929(12)
Authors: Koochaki, Javid; Bokhorst, Jos A.C.; Wortmann, Hans; Klingenberg, Warse

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Justification for the selection of manufacturing technologies: a fuzzy-decision-tree-based approach
pp. 6945-6962(18)
Authors: Evans, Liam; Lohse, Niels; Tan, Kim Hua; Webb, Phil; Summers, Mark

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An integrated EPQ model based on a control chart for an imperfect production process
pp. 6999-7011(13)
Authors: Pan, Ershun; Jin, Yao; Wang, Shuyi; Cang, Ting

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A fuzzy approach for sequencing interrelated activities in a DSM
pp. 7012-7025(14)
Authors: Lin, Jun; Qian, Yanjun; Yassine, Ali A.; Cui, Wentian

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Maintenance policy selection in manufacturing firms using the fuzzy MCDM approach
pp. 7044-7056(13)
Authors: Chan, Felix T.S.; Prakash, Anuj

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Evaluating ERP implementation choices on the basis of customisation using fuzzy AHP
pp. 7057-7067(11)
Authors: Sarfaraz, Ahmad; Jenab, Kouroush; D'Souza, Amanda C.

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