Decentralized diagnosis based on Boolean discrete event models: application on manufacturing systems

Authors: Sayed-Mouchaweh, M.¹; Philippot, A.²; Carre-Menetrier, V.¹

Source: International Journal of Production Research, Volume 46, Number 19, October 2008 , pp. 5469-5490(22)

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Abstract:

This paper proposes a decentralized structure based on a set of local diagnosers to monitor discrete event manufacturing systems with discrete sensors and actuators. The occurrence of any fault entailing the violation of the desired behaviour must be detected and isolated by at least one local diagnoser using its own local observation about the system execution. These local diagnosers infer the fault's occurrence using event sequences, time delays between correlated events and state conditions, characterized by sensors readings and commands issued by the controller. A very limited communication among diagnosers is permitted through a simple coordinator based on a set of rules. The goal is to solve the problem of diagnosis's decision ambiguity due to the partial observation of diagnosers. An adapted codiagnosability notion is formally defined in order to ensure that the set of local diagnosers is able to diagnose all faults entailing the violation of the desired behaviour within a bounded delay. We show that the construction of these diagnosers is polynomial in the size of the system. An example is used to illustrate the proposed approach.

Keywords: Fault diagnosis; Discrete event manufacturing systems; Decentralized diagnosis; Diagnosability notion; Codiagnosability notion

Document Type: Research article

DOI: http://dx.doi.org/10.1080/00207540802367074

Affiliations: 1: Universite de Reims, Reims, France 2: LURPA, Cachan, France

Publication date: 2008-10-01

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