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Publisher: Taylor and Francis Ltd

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Volume 45, Number 23, December 2007

Editorial
pp. 5453-5454(2)

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A new direction in quality engineering: supply chain quality modelling
pp. 5455-5464(10)
Authors: Batson, R. G.; McGough, K. D.

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Supply-chain oriented robust parameter design
pp. 5465-5484(20)
Authors: An, N.; Lu, J. -C.; Rosen, D.; Ruan, L.

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Integrating a bi-objective paradigm to tolerance optimization
pp. 5509-5525(17)
Authors: Shin, S.; Cho, B. R.

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Tuned artificial contrasts to detect signals
pp. 5527-5534(8)
Authors: Hu, J.; Runger, G.; Tuv, E.

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Detecting a change in a scale parameter - a combination of SPC and change point procedures
pp. 5535-5545(11)
Authors: Schechtman, E.; Bandner, G.; Meginy, S.

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Process monitoring for mean shifts for multiple stage processes
pp. 5547-5570(24)
Authors: Jearkpaporn, D.; Borror, C. M.; Runger, G. C.; Montgomery, D. C.

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Monitoring feedback-controlled processes using adaptive T2 schemes
pp. 5601-5619(19)
Authors: Wang, Kaibo; Tsung, Fugee

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Economic design of VSI [image omitted] control charts
pp. 5639-5648(10)
Authors: Yu, Fong-Jung; Rahim, M. A.; Chin, Hsiang

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A control chart for the Gamma distribution as a model of time between events
pp. 5649-5666(18)
Authors: Zhang, C. W.; Xie, M.; Liu, J. Y.; Goh, T. N.

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