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Publisher: Taylor and Francis Ltd

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Volume 45, Number 3, February 2007

Recent developments in modelling and analysis of semiconductor manufacturing
pp. 485-486(2)
Authors: Lendermann, Peter; Fowler, John; Xie, Min

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Scheduling a wet station for wafer cleaning with multiple job flows and multiple wafer-handling robots
pp. 487-507(21)
Authors: Lee, Tae-Eog; Lee, Hwan-Yong; Lee, Sang-Jin

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Constructing the OGE for promoting tool group productivity in semiconductor manufacturing
pp. 509-524(16)
Authors: Chien, Chen-Fu; Chen, Hsin-Kai; Wu, Jei-Zheng; Hu, Chih-Han

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Modelling inherent worker differences for workforce planning
pp. 525-553(29)
Authors: Wirojanagud, Pornsarun; Gel, Esma; Fowler, John; Cardy, Robert

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Analytical approach to estimating AMHS performance in 300 mm fabs
pp. 571-590(20)
Authors: Nazzal, Dima; McGinnis, Leon

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Controlling delivery performance in semiconductor manufacturing using Look Ahead Batching
pp. 591-613(23)
Authors: Gupta, Amit Kumar; Sivakumar, Appa Iyer

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Make-to-order scheduling in foundry semiconductor fabrication
pp. 615-630(16)
Authors: Kang, Kyung Hwan; Lee, Young Hoon

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Optimal supply chain configurations in semiconductor manufacturing
pp. 631-651(21)
Authors: Chiang, David; Guo, Ruey-Shan; Chen, Argon; Cheng, Meng-Tse; Chen, Cheng-Bang

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Reverse auction-based job assignment among foundry fabs
pp. 653-673(21)
Authors: Chang, Shi-Chung; Hsieh, Ming-Ming; Chen, Chia-Wei

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Analysis of a borderless fab using interoperating AutoSched AP models
pp. 675-697(23)
Authors: Gan, Boon Ping; Liow, Long Foong; Gupta, Amit Kumar; Lendermann, Peter; Turner, Stephen John; Wang, Xiaoguang

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A single CUSUM chart using a single observation to monitor a variable
pp. 719-741(23)
Authors: Wu, Zhang; Wang, Qinan

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A study of EWMA chart with transformed exponential data
pp. 743-763(21)
Authors: Liu, Ji Ying; Xie, Min; Goh, Thong Ngee; Chan, L. Y.

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An approach to the dynamic detection of outliers in electronics production
pp. 765-778(14)
Authors: Hill, J. F.; Morris, C.; Gabriel, R.

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