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Publisher: Taylor and Francis Ltd

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Volume 44, Number 13, 1 July 2006

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Capacity planning with reconfigurable kits in semiconductor test manufacturing
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Authors: Zhang, Z.; Zhang, M. T.; Niu, S.; Zheng, L.

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Flexible automatic converting of NC programs. A cross-compiler for structured text
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An improved MCDM DEA model for technology selection
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A simulation study of pull systems with ascending/descending buffers and stochastic processing times
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Authors: Grosfeld-Nir, Abraham; Magazine, Michael

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