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Publisher: Taylor and Francis Ltd

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Volume 42, Number 19, October 1, 2004

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A digraph approach to TQM evaluation of an industry
pp. 4031-4053(23)
Authors: Grover, Sandeep; Agrawal, V. P.; Khan, I. A.

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Genetic algorithm for facilities layout problems based on slicing tree structure
pp. 4055-4067(13)
Authors: Shayan, E.; Chittilappilly, A.

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Optimal part deposition orientation in FDM by using a multicriteria genetic algorithm
pp. 4069-4089(21)
Authors: Pandey, P. M.; Thrimurthulu, K.; Reddy, N. Venkata

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Scheduling parallel batch processing machines with arbitrary job sizes and incompatible job families
pp. 4091-4107(17)
Authors: Koh, Shie-Gheun; Koo, Pyung-Hoi; Ha, Jae-Won; Lee, Woon-Seek

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Integrating statistical process control, engineering process control and Taguchi's quality engineering
pp. 4109-4118(10)
Authors: Duffuaa, S. O.; Khursheed, S. N.; Noman, S. M.

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Recognition of defect spatial patterns in semiconductor fabrication
pp. 4153-4172(20)
Authors: Hsieh, H.-W.; Chen, F.-L.

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Minimizing makespan on parallel batch processing machines
pp. 4211-4220(10)
Authors: Chang, P.-Y.; Damodaran, P.; Melouk, S.

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