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Publisher: Taylor and Francis Ltd

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Volume 42, Number 2, January 15, 2004

Scheduling of wafer test processes in semiconductor manufacturing
pp. 215-242(28)
Authors: Ellis, K. P.; Lu, Y.; Bish, E. K.

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A hybrid GA/heuristic approach to the simultaneous scheduling of machines and automated guided vehicles
pp. 267-281(15)
Authors: Abdelmaguid, Tamer F.; Nassef, Ashraf O.; Kamal, Badawia A.; Hassan, Mohamed F.

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Collaborative order management in distributed manufacturing
pp. 283-302(20)
Authors: Abid, C.; D'amours, S.; Montreuil, B.

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Optimization of robust design for multiple quality characteristics
pp. 337-354(18)
Authors: Wu, Ful-Chiang; Chyu, Chiuh-Cheng

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Optimal maintenance planning and crew allocation for multipurpose batch plants
pp. 355-377(23)
Authors: Suryadi, H.; Papageorgiou, L. G.

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Optimization design of control charts based on Taguchi's loss function and random process shifts
pp. 379-390(12)
Authors: Wu, Z.; Shamsuzzaman, M.; Pan, E. S.

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